Face Recognition in Adverse Conditions
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Face Recognition in Adverse Conditions

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Release Date: April, 2014|Copyright: © 2014 |Pages: 480
DOI: 10.4018/978-1-4666-5966-7
ISBN13: 9781466659667|ISBN10: 1466659661|EISBN13: 9781466659674
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Description & Coverage
Description:

Facial recognition software has improved by leaps and bounds over the past few decades, with error rates decreasing significantly within the past ten years. Though this is true, conditions such as poor lighting, obstructions, and profile-only angles have continued to persist in preventing wholly accurate readings.

Face Recognition in Adverse Conditions examines how the field of facial recognition takes these adverse conditions into account when designing more effective applications by discussing facial recognition under real world PIE variations, current applications, and the future of the field of facial recognition research. The work is intended for academics, engineers, and researchers specializing in the field of facial recognition.

Coverage:

The many academic areas covered in this publication include, but are not limited to:

  • 2D-3D Mixed Face Recognition Schemes
  • Automatic Face Image Tagging
  • Face Images with Disguise Variations
  • Face Recognition for Mobile Applications
  • Facial Action Recognition
  • Illumination Normalization in Face Recognition
  • Intelligent Local Face Recognition
  • Multiresolution Methods in Face Recognition
  • Quality-Based Fusion in Adverse Conditions
  • Robust Face Recognition Systems
Reviews & Statements

The "adverse conditions" of the title include obstructions, poor lighting and unfortunate angles that have presented serious obstacles to face-recognition technology up to today, despite the general improvement in applications. This is a collection of papers presented by international teams of researchers, developers and practitioners detailing specific solutions to these problems, both implemented and proposed. Several introductory chapters provide preliminary material on the applications and the issues presented by attempts to implement the technology in uncontrolled settings. The heart of the book is its second section, concentrating on specific algorithms and proposed solutions: face recognition in the presence of partial data and occlusions, the use of spatial relations and face recognition classifiers, recognizing disguised faces, and the use of ocular data. The third section describes a plethora of applications: re-identification, automatic face tagging, and face recognition for mobile applications. The final section describes future directions and provides a re-cap of achieved advances so far.

– ProtoView Book Abstracts (formerly Book News, Inc.)
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Editor/Author Biographies
Maria De Marsico was born in Salerno, Italy, in 1963. She received the Laurea degree (cum laude) in Computer Science from the University of Salerno, Italy, in 1988. She is currently an Assistant Professor of Computer Science at Sapienza University of Rome. Her main research interests include pattern recognition, multibiometric systems, image processing, human-computer interaction. In the field of biometrics, she collaborates with BIPLab at University of Salerno. She has been member of the Program Committees of many international conferences, and is member of the Editorial Board of the IEEE Biometris Compendium. Maria De Marsico is a member of IEEE, ACM, and IAPR.
Michele Nappi was born in Naples, Italy, in 1965. He received the laurea degree (cum laude) in computer science from the University of Salerno, Salerno, Italy, in 1991, the M.Sc. degree in information and communication technology from I.I.A.S.S. ŒE.R. Caianiello, Vietri sul Mare, Salerno, and the Ph.D. degree in applied mathematics and computer science from the University of Padova, Padova, Italy. He is currently an Associate Professor of computer science at the University of Salerno. His research interests include multibiometric systems, pattern recognition, image processing, compression and indexing, multimedia databases, and human-computer interaction. Dr. Nappi is a member of IEEE and IAPR.
Massimo Tistarelli was born on November 11, 1962 in Genoa, Italy. He received the PhD in Computer Science and Robotics in 1991 from the University of Genoa. He is Full Professor in Computer Science (with tenure) and director of the Computer Vision Laboratory at the University of Sassari, Italy. Since 1986, he has been involved as project coordinator and task manager in several projects on computer vision and biometrics funded by the European Community. Since 1994, he has been the director of the Computer Vision Laboratory at the Department of Communication, Computer and Systems Science of the University of Genoa, and now at the University of Sassari, leading several National and European projects on computer vision applications and image-based biometrics. He is a founding member of the Biosecure Foundation, which includes all major European research centers working in biometrics. He is the Chair of the Management Committee of the European Union COST Action IC1106 “Integrating Biometrics and Forensics for the Digital Age.” His main research interests cover biological and artificial vision (particularly in the area of recognition, three-dimensional reconstruction, and dynamic scene analysis), pattern recognition, biometrics, visual sensors, robotic navigation, and visuo-motor coordination. He is co-author of more than 100 scientific papers in peer-reviewed books, conferences, and international journals. He is the principal editor for the Springer book Handbook of Remote Biometrics, published in June 2009. Prof. Tistarelli is one of the world-recognized leading researchers in the area of biometrics, especially in the field of face recognition and multimodal fusion. He is the Scientific Director of the Italian Platform for Biometric Technologies (established from the Italian Ministry of the University and Scientific Research), chair of the IAPR Technical Committee 4 on Biometrics, President of the Italian Chapter of the IEEE Biometrics Coucil, Member of the IEEE Biometrics Professional Certification Committee, Fellow member of IAPR, and Senior member of IEEE.
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